{"title":"LSM视觉测量器R&R研究","authors":"W. S. Messina, L.G. Willey, K. W. Jones","doi":"10.1109/IEMT.1995.526194","DOIUrl":null,"url":null,"abstract":"The purpose of this study is to assess whether the laser scanning microscope (LSM) is capable of measuring solder paste height. The LSM projects a scanning laser beam onto the PC board which is deflected around the solder paste deposit. The height of the paste was determined by taking the difference between the highest (top) and lowest (bottom) laser deflection points on and surrounding the paste deposit respectively.","PeriodicalId":123707,"journal":{"name":"Seventeenth IEEE/CPMT International Electronics Manufacturing Technology Symposium. 'Manufacturing Technologies - Present and Future'","volume":"51 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"LSM vision gage R&R study\",\"authors\":\"W. S. Messina, L.G. Willey, K. W. Jones\",\"doi\":\"10.1109/IEMT.1995.526194\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The purpose of this study is to assess whether the laser scanning microscope (LSM) is capable of measuring solder paste height. The LSM projects a scanning laser beam onto the PC board which is deflected around the solder paste deposit. The height of the paste was determined by taking the difference between the highest (top) and lowest (bottom) laser deflection points on and surrounding the paste deposit respectively.\",\"PeriodicalId\":123707,\"journal\":{\"name\":\"Seventeenth IEEE/CPMT International Electronics Manufacturing Technology Symposium. 'Manufacturing Technologies - Present and Future'\",\"volume\":\"51 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1995-10-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Seventeenth IEEE/CPMT International Electronics Manufacturing Technology Symposium. 'Manufacturing Technologies - Present and Future'\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEMT.1995.526194\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Seventeenth IEEE/CPMT International Electronics Manufacturing Technology Symposium. 'Manufacturing Technologies - Present and Future'","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEMT.1995.526194","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The purpose of this study is to assess whether the laser scanning microscope (LSM) is capable of measuring solder paste height. The LSM projects a scanning laser beam onto the PC board which is deflected around the solder paste deposit. The height of the paste was determined by taking the difference between the highest (top) and lowest (bottom) laser deflection points on and surrounding the paste deposit respectively.