基于数字建模的模数转换器测试研究

L.M. Hon, A. A'Ain
{"title":"基于数字建模的模数转换器测试研究","authors":"L.M. Hon, A. A'Ain","doi":"10.1109/TENCON.2004.1414915","DOIUrl":null,"url":null,"abstract":"This paper presents an analysis of test results of digital model approach on Analogue-to-digital converter (ADC). The approach is to inject primary input with arbitrary frequencies and periodical digital pulse. The output response is sampled and analysed in order to distinguish between GO or No-GO. Furthermore, the proposed technique is also coupled with power supply voltage control test technique to investigate the fault coverage margin. Histogram test, conventional industrial test technique, simulates concurrently were also employed as a comparison study.","PeriodicalId":434986,"journal":{"name":"2004 IEEE Region 10 Conference TENCON 2004.","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-12-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"An investigation on ADC testing using digital modelling\",\"authors\":\"L.M. Hon, A. A'Ain\",\"doi\":\"10.1109/TENCON.2004.1414915\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents an analysis of test results of digital model approach on Analogue-to-digital converter (ADC). The approach is to inject primary input with arbitrary frequencies and periodical digital pulse. The output response is sampled and analysed in order to distinguish between GO or No-GO. Furthermore, the proposed technique is also coupled with power supply voltage control test technique to investigate the fault coverage margin. Histogram test, conventional industrial test technique, simulates concurrently were also employed as a comparison study.\",\"PeriodicalId\":434986,\"journal\":{\"name\":\"2004 IEEE Region 10 Conference TENCON 2004.\",\"volume\":\"11 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-12-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2004 IEEE Region 10 Conference TENCON 2004.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TENCON.2004.1414915\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2004 IEEE Region 10 Conference TENCON 2004.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TENCON.2004.1414915","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

本文分析了数字模型方法在模数转换器(ADC)上的测试结果。该方法是在主输入中注入任意频率的周期性数字脉冲。对输出响应进行采样和分析,以区分GO或No-GO。此外,该方法还与电源电压控制测试技术相结合,研究了故障覆盖裕度。采用传统的工业检验技术直方图检验和模拟并行法进行对比研究。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
An investigation on ADC testing using digital modelling
This paper presents an analysis of test results of digital model approach on Analogue-to-digital converter (ADC). The approach is to inject primary input with arbitrary frequencies and periodical digital pulse. The output response is sampled and analysed in order to distinguish between GO or No-GO. Furthermore, the proposed technique is also coupled with power supply voltage control test technique to investigate the fault coverage margin. Histogram test, conventional industrial test technique, simulates concurrently were also employed as a comparison study.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信