单事件瞬态检测的批量内置电流传感器方法

2007 International Symposium on System-on-Chip Pub Date : 2007-11-01 DOI:10.1109/ISSOC.2007.4427422

G. Wirth, C. Fayomi

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引用次数: 20

摘要

随着器件尺寸的缩小，辐射效应，特别是单事件瞬变(set)，正日益影响集成电路的可靠性。本文介绍了使用批量内置电流传感器(bulk - bics)进行SET检测。通过器件级和电路级仿真，验证了本体- bics方法在单事件瞬态检测中的有效性和适用性。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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The Bulk Built In Current Sensor Approach for Single Event Transient Detection

Radiation effects, particularly single event transients (SETs), are increasingly affecting the reliability of integrated circuits as device dimensions are scaling down. This paper presents the use of bulk built in current sensors (Bulk-BICS) for SET detection. The efficiency and applicability of the bulk-BICS approach for Single Event Transient detection is demonstrated through device and circuit level simulations.

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2007 International Symposium on System-on-Chip

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