{"title":"基于延迟传播的分层测试生成","authors":"M. Karam, R. Leveugle, G. Saucier","doi":"10.1109/TEST.1991.519739","DOIUrl":null,"url":null,"abstract":"A hierarchical test generation method is presented which is based on a functional approach to guide backward and forward propagations. The proposed algorithm permits solving most propagation conflicts by taking advantage of the functionality of the implemented block and avoids costly unnecessary design modifications. It has been implemented and its effectiveness has been proved on a set of datapaths. The formalism and the algorithms are general enough to handle any type of synchronous digital circuit.","PeriodicalId":272630,"journal":{"name":"1991, Proceedings. International Test Conference","volume":"96 7-12","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"21","resultStr":"{\"title\":\"Hierarchical Test Generation Based on Delayed Propagation\",\"authors\":\"M. Karam, R. Leveugle, G. Saucier\",\"doi\":\"10.1109/TEST.1991.519739\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A hierarchical test generation method is presented which is based on a functional approach to guide backward and forward propagations. The proposed algorithm permits solving most propagation conflicts by taking advantage of the functionality of the implemented block and avoids costly unnecessary design modifications. It has been implemented and its effectiveness has been proved on a set of datapaths. The formalism and the algorithms are general enough to handle any type of synchronous digital circuit.\",\"PeriodicalId\":272630,\"journal\":{\"name\":\"1991, Proceedings. International Test Conference\",\"volume\":\"96 7-12\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-10-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"21\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1991, Proceedings. International Test Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.1991.519739\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1991, Proceedings. International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1991.519739","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Hierarchical Test Generation Based on Delayed Propagation
A hierarchical test generation method is presented which is based on a functional approach to guide backward and forward propagations. The proposed algorithm permits solving most propagation conflicts by taking advantage of the functionality of the implemented block and avoids costly unnecessary design modifications. It has been implemented and its effectiveness has been proved on a set of datapaths. The formalism and the algorithms are general enough to handle any type of synchronous digital circuit.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
