Biruk Mammo, J. Larimer, M. Morgan, Da-juan Fan, Eric Hennenhoefer, V. Bertacco
{"title":"多处理器验证的基于体系结构跟踪的功能覆盖","authors":"Biruk Mammo, J. Larimer, M. Morgan, Da-juan Fan, Eric Hennenhoefer, V. Bertacco","doi":"10.1109/MTV.2012.12","DOIUrl":null,"url":null,"abstract":"Functional coverage plays a pivotal role in assuring the quality of input stimuli used in the verification of modern digital designs. For an out-of-order multi-processor design, simulation of a detailed model of the design is often required to observe relevant design behaviors for functional coverage. However, since such a model is not available during the early phases of test development, verification teams are forced to wait until much later in the verification process to evaluate the quality of their test cases. Even then, the quality of the tests can be assured only on one specific design implementation - an undesirable characteristic for test and regression suites that are meant to be used across multiple generations and/or implementations of an architecture. This work addresses this issue by presenting a novel, implementation-independent, execution trace-based, coverage collection solution. Our solution enables the early evaluation of multi-processor tests using a high-level model of a design. In addition, it can be deployed with detailed design models, if desired, for further analysis alongside implementation-specific coverage models.","PeriodicalId":201401,"journal":{"name":"2012 13th International Workshop on Microprocessor Test and Verification (MTV)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Architectural Trace-Based Functional Coverage for Multiprocessor Verification\",\"authors\":\"Biruk Mammo, J. Larimer, M. Morgan, Da-juan Fan, Eric Hennenhoefer, V. Bertacco\",\"doi\":\"10.1109/MTV.2012.12\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Functional coverage plays a pivotal role in assuring the quality of input stimuli used in the verification of modern digital designs. For an out-of-order multi-processor design, simulation of a detailed model of the design is often required to observe relevant design behaviors for functional coverage. However, since such a model is not available during the early phases of test development, verification teams are forced to wait until much later in the verification process to evaluate the quality of their test cases. Even then, the quality of the tests can be assured only on one specific design implementation - an undesirable characteristic for test and regression suites that are meant to be used across multiple generations and/or implementations of an architecture. This work addresses this issue by presenting a novel, implementation-independent, execution trace-based, coverage collection solution. Our solution enables the early evaluation of multi-processor tests using a high-level model of a design. In addition, it can be deployed with detailed design models, if desired, for further analysis alongside implementation-specific coverage models.\",\"PeriodicalId\":201401,\"journal\":{\"name\":\"2012 13th International Workshop on Microprocessor Test and Verification (MTV)\",\"volume\":\"3 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-12-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 13th International Workshop on Microprocessor Test and Verification (MTV)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MTV.2012.12\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 13th International Workshop on Microprocessor Test and Verification (MTV)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MTV.2012.12","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Architectural Trace-Based Functional Coverage for Multiprocessor Verification
Functional coverage plays a pivotal role in assuring the quality of input stimuli used in the verification of modern digital designs. For an out-of-order multi-processor design, simulation of a detailed model of the design is often required to observe relevant design behaviors for functional coverage. However, since such a model is not available during the early phases of test development, verification teams are forced to wait until much later in the verification process to evaluate the quality of their test cases. Even then, the quality of the tests can be assured only on one specific design implementation - an undesirable characteristic for test and regression suites that are meant to be used across multiple generations and/or implementations of an architecture. This work addresses this issue by presenting a novel, implementation-independent, execution trace-based, coverage collection solution. Our solution enables the early evaluation of multi-processor tests using a high-level model of a design. In addition, it can be deployed with detailed design models, if desired, for further analysis alongside implementation-specific coverage models.