{"title":"一种新型的超深亚微米辐射强化设计锁存器","authors":"Zhengfeng Huang, Huaguo Liang","doi":"10.1109/IOLTS.2008.9","DOIUrl":null,"url":null,"abstract":"Soft errors induced by cosmic radiation have become an urgent issue for ultra-deep-sub-micron (UDSM) technologies. In this paper, we propose a new radiation hardened by design latch (RHBDL). RHBDL can improve robustness by masking the soft errors induced by SEU and SET. We evaluate the propagation delay, power dissipation and power delay product of RHBDL using SPICE simulations. Compared with existing reported solutions such as TMR-latch, RHBDL is less SEU-sensitive, more area efficient, delay and power efficient.","PeriodicalId":261786,"journal":{"name":"2008 14th IEEE International On-Line Testing Symposium","volume":"23 3","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-07-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"A New Radiation Hardened by Design Latch for Ultra-Deep-Sub-Micron Technologies\",\"authors\":\"Zhengfeng Huang, Huaguo Liang\",\"doi\":\"10.1109/IOLTS.2008.9\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Soft errors induced by cosmic radiation have become an urgent issue for ultra-deep-sub-micron (UDSM) technologies. In this paper, we propose a new radiation hardened by design latch (RHBDL). RHBDL can improve robustness by masking the soft errors induced by SEU and SET. We evaluate the propagation delay, power dissipation and power delay product of RHBDL using SPICE simulations. Compared with existing reported solutions such as TMR-latch, RHBDL is less SEU-sensitive, more area efficient, delay and power efficient.\",\"PeriodicalId\":261786,\"journal\":{\"name\":\"2008 14th IEEE International On-Line Testing Symposium\",\"volume\":\"23 3\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-07-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 14th IEEE International On-Line Testing Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IOLTS.2008.9\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 14th IEEE International On-Line Testing Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IOLTS.2008.9","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A New Radiation Hardened by Design Latch for Ultra-Deep-Sub-Micron Technologies
Soft errors induced by cosmic radiation have become an urgent issue for ultra-deep-sub-micron (UDSM) technologies. In this paper, we propose a new radiation hardened by design latch (RHBDL). RHBDL can improve robustness by masking the soft errors induced by SEU and SET. We evaluate the propagation delay, power dissipation and power delay product of RHBDL using SPICE simulations. Compared with existing reported solutions such as TMR-latch, RHBDL is less SEU-sensitive, more area efficient, delay and power efficient.
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