{"title":"高分辨率数字可编程电位器性能分析","authors":"G. Chiranu, C. Tudoran, O. Neagoe, G. Brezeanu","doi":"10.1109/SMICND.2019.8923775","DOIUrl":null,"url":null,"abstract":"This paper aims to find adequate solutions for implementing a high resolution digitally programmable potentiometer by taking into consideration the production cost and also the performance indicators such as the linearity characteristics. All described solutions were implemented in a 5V 0.18μm CMOS process and their performances were verified by simulations.","PeriodicalId":151985,"journal":{"name":"2019 International Semiconductor Conference (CAS)","volume":"7 19","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Performance Analysis for High Resolution Digitally Programmable Potentiometers\",\"authors\":\"G. Chiranu, C. Tudoran, O. Neagoe, G. Brezeanu\",\"doi\":\"10.1109/SMICND.2019.8923775\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper aims to find adequate solutions for implementing a high resolution digitally programmable potentiometer by taking into consideration the production cost and also the performance indicators such as the linearity characteristics. All described solutions were implemented in a 5V 0.18μm CMOS process and their performances were verified by simulations.\",\"PeriodicalId\":151985,\"journal\":{\"name\":\"2019 International Semiconductor Conference (CAS)\",\"volume\":\"7 19\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 International Semiconductor Conference (CAS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SMICND.2019.8923775\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 International Semiconductor Conference (CAS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SMICND.2019.8923775","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Performance Analysis for High Resolution Digitally Programmable Potentiometers
This paper aims to find adequate solutions for implementing a high resolution digitally programmable potentiometer by taking into consideration the production cost and also the performance indicators such as the linearity characteristics. All described solutions were implemented in a 5V 0.18μm CMOS process and their performances were verified by simulations.