两种静态32kb存储器的地面试验与飞行数据比较

1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471) Pub Date : 1999-09-13 DOI:10.1109/RADECS.1999.858646

P. Cheynet, R. Valazco, R. Ecoffet, S. Duzellier, J. David, J.G. Loquet

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引用次数: 9

摘要

微电子和光子学试验台(MPTB)载于一颗科学卫星上进行24项实验，自1997年11月以来一直在高辐射轨道上运行。本文介绍了在两个MPTB实验中包含的两个商用静态RAMs的单事件扰动飞行结果。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Comparison between ground tests and flight data for two static 32 KB memories

The microelectronics and photonics testbed (MPTB) carrying twenty-four experiments on-board a scientific satellite has been in a high radiation orbit since November 1997. This paper presents single event Upset flight results on two commercial static RAMs includes in two of the MPTB experiments.

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来源期刊

1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471)

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