金刚石超结(SJ)工艺发展:具有金刚石增强超结(SPADES)的超晶格功率放大器

S. Afroz, Virginia Wheeler, M. Tadjer, J. Gallagher, G. Foster, K. Hobart, Brian Novak, Ken A. Nagamatsu, K. Frey, P. Shea, R. Howell, Josephine B. Chang, A. Koehler, T. Feygelson
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引用次数: 3

摘要

采用金刚石增强超结(SPADES)器件的超晶格功率放大器(superlattice Power Amplifier,简称SPADES),可使超晶格Castellated场效应晶体管(SLCFET)器件的击穿电压提高2倍。在SLCFET的漏极区加入金刚石超结(SJ)之前被预测可以在对性能影响最小的情况下提高击穿电压。p型掺杂纳米晶金刚石(NCD)生长在SLCFET漏极区的蚀刻沟槽内,并与栅极相连,形成有源垂直场板,以横向分布电场。在高漏极偏压下,载流脊和漏极区形成互耗尽区。与金属场极板相比,这导致寄生电容更低,这是毫米波应用的一个重要考虑因素。在具有NCD SJ的器件上,我们观察到最小的电容损失,低色散和击穿电压行为与TCAD模型预测一致。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Diamond Superjunction (SJ) Process Development: Super-Lattice Power Amplifier with Diamond Enhanced Superjunction (SPADES)
The Super-Lattice Power Amplifier with Diamond Enhanced Superjunction (SPADES) device is being developed to enable a 2x increase in breakdown voltage of a Super-Lattice Castellated Field Effect Transistor (SLCFET) device. Incorporation of a diamond superjunction (SJ) within the drain region of a SLCFET was previously predicted to improve breakdown voltage with minimal impact on performance. P-type doped nanocrystalline diamond (NCD) is grown within etched trenches in the drain region of a SLCFET and tied to the gate, forming an active vertical field plate to laterally distribute electric field. Under high drain bias, mutual depletion regions are formed in the current carrying ridges and NCD in the drain region. This results in lower parasitic capacitance compared to a metal field plate, an important consideration for millimeter wave applications. On devices with an NCD SJ, we observe minimal capacitance penalty, low dispersion, and breakdown voltage behavior consistent with TCAD model prediction.
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