通用高效的多表遍历并行故障仿真

P. Montessoro, S. Gai
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引用次数: 6

摘要

在对超大规模集成电路进行故障仿真时,精度、通用性和效率是关键因素。当需要通用性和准确性时,并行算法是唯一的解决方案。它对网络状态的差分表示节省了内存和CPU时间,但由于其复杂性,一旦在门之后添加更高的抽象级别,实现的规模就会增长,性能就会下降。本文讨论了最小信息概念,并给出了最小信息概念在并发事件驱动仿真关键算法中的应用。本文首次在真正统一的环境中提出了多列表遍历(MLT)、触发抑制、兄弟事件处理、列表事件、边缘敏感输入、编译驱动的评估函数、功能故障源和时钟抑制等新的先进通用技术。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
General and efficient multiple list traversal for concurrent fault simulation
Accuracy, generality and efficiency are critical factors when fault simulation of VLSI circuits is the target. The concurrent algorithm is the only solution when generality and accuracy is required. Its differential representation of the network status saves memory and CPU time, but due to its complexity the implementations grow in size and lose in performance as soon as higher abstraction levels are added beyond the gate one. In the paper the minimal information concept is discussed, and its applications to the key algorithms for concurrent event-driven simulation are shown. New advanced generalized techniques for multiple list traversal (MLT), trigger inhibition, fraternal event processing, list events, edge sensitive inputs, compile-driven evaluation functions, functional fault sources and clock suppression are presented for the first time in a truly unified context.<>
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