{"title":"高性能设计的顺序等效技术","authors":"S. Balakrishnan","doi":"10.1109/ICASIC.2007.4415840","DOIUrl":null,"url":null,"abstract":"Quite often in semiconductor industry, when a product is nearing its launch date, most of us have had the deja-vu situation of performance to time-to-market trade-offs; especially in high-performance designs. Sequential equivalence checking opens up possibilities in this area, by enabling performance-tuning related sequential micro-architectural changes to be verified with significantly lower impact on effort estimates and risk. This nascent technology promises to change the way we look at eleventh hour changes.","PeriodicalId":120984,"journal":{"name":"2007 7th International Conference on ASIC","volume":"27 41","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Sequential equivalence techniques for high performance design\",\"authors\":\"S. Balakrishnan\",\"doi\":\"10.1109/ICASIC.2007.4415840\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Quite often in semiconductor industry, when a product is nearing its launch date, most of us have had the deja-vu situation of performance to time-to-market trade-offs; especially in high-performance designs. Sequential equivalence checking opens up possibilities in this area, by enabling performance-tuning related sequential micro-architectural changes to be verified with significantly lower impact on effort estimates and risk. This nascent technology promises to change the way we look at eleventh hour changes.\",\"PeriodicalId\":120984,\"journal\":{\"name\":\"2007 7th International Conference on ASIC\",\"volume\":\"27 41\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 7th International Conference on ASIC\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICASIC.2007.4415840\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 7th International Conference on ASIC","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICASIC.2007.4415840","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Sequential equivalence techniques for high performance design
Quite often in semiconductor industry, when a product is nearing its launch date, most of us have had the deja-vu situation of performance to time-to-market trade-offs; especially in high-performance designs. Sequential equivalence checking opens up possibilities in this area, by enabling performance-tuning related sequential micro-architectural changes to be verified with significantly lower impact on effort estimates and risk. This nascent technology promises to change the way we look at eleventh hour changes.