一种新的试验压缩方案

Proceedings Twelfth International Conference on VLSI Design. (Cat. No.PR00013) Pub Date : 1999-01-10 DOI:10.1109/ICVD.1999.745131

B. Bhaumik, G. Visweswaran, R. Lakshminarasimhan

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引用次数: 0

摘要

提出了一种新的测试输出数据压缩方案——p阶广义修正位置症候群(GMPS)。阶数p决定了混叠概率和实现该方案所需的硬件开销。二阶GMPS给出的混叠概率比文献中报道的使用最少额外硬件的最佳方案低一个数量级。提出了GMPS的硬件实现方案。该方案采用带反馈的加法器。

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A new test compression scheme

Generalized Modified Positional Syndrome (GMPS), of order p, a new compaction scheme for test output data is presented. The order p determines the aliasing probability and the amount of hardware overhead required to implement the scheme. GMPS of order two gives an aliasing probability about an order of magnitude lower than the best scheme reported in literature with minimal extra hardware. A hardware realization scheme for GMPS has been presented. The scheme uses adders with feedback.

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Proceedings Twelfth International Conference on VLSI Design. (Cat. No.PR00013)

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