架构级TSV计数最小化的三维树型FPGA方法

V. Pangracious, H. Mehrez, Z. Marrakchi
{"title":"架构级TSV计数最小化的三维树型FPGA方法","authors":"V. Pangracious, H. Mehrez, Z. Marrakchi","doi":"10.1109/CoolChips.2013.6547925","DOIUrl":null,"url":null,"abstract":"The CMOS technology scaling has greatly improved the overall performance and density of Field Programmable Gate Array (FPGA), nonetheless the performance gap between FPGA and ASIC has remain very wide mainly due the programming overhead of FPGA. Three-Dimensional (3D) integration is a promising technology to reduce wire lengths. Through Silicon Vias (TSV) provide electrical connectivity between multiple active device planes in 3D integrated Circuits (ICs). TSVs require a significant silicon area compared to planar interconnects and also bring critical challenges to design of 3D ICs. In this paper we propose an architectural level TSV count optimization solution to minimize the TSV count without compromising the chip performance. The experimental results shows we are able to minimize 40% of TSV count in 3D Tree-based FPGA.","PeriodicalId":340576,"journal":{"name":"2013 IEEE COOL Chips XVI","volume":"46 2","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-04-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Architecture level TSV count minimization methodology for 3D tree-based FPGA\",\"authors\":\"V. Pangracious, H. Mehrez, Z. Marrakchi\",\"doi\":\"10.1109/CoolChips.2013.6547925\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The CMOS technology scaling has greatly improved the overall performance and density of Field Programmable Gate Array (FPGA), nonetheless the performance gap between FPGA and ASIC has remain very wide mainly due the programming overhead of FPGA. Three-Dimensional (3D) integration is a promising technology to reduce wire lengths. Through Silicon Vias (TSV) provide electrical connectivity between multiple active device planes in 3D integrated Circuits (ICs). TSVs require a significant silicon area compared to planar interconnects and also bring critical challenges to design of 3D ICs. In this paper we propose an architectural level TSV count optimization solution to minimize the TSV count without compromising the chip performance. The experimental results shows we are able to minimize 40% of TSV count in 3D Tree-based FPGA.\",\"PeriodicalId\":340576,\"journal\":{\"name\":\"2013 IEEE COOL Chips XVI\",\"volume\":\"46 2\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-04-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 IEEE COOL Chips XVI\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CoolChips.2013.6547925\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE COOL Chips XVI","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CoolChips.2013.6547925","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

摘要

CMOS技术的扩展极大地提高了现场可编程门阵列(FPGA)的整体性能和密度,但由于FPGA的编程开销,FPGA与ASIC之间的性能差距仍然很大。三维(3D)集成是一种很有前途的缩短导线长度的技术。通过硅通孔(TSV)在3D集成电路(ic)中提供多个有源器件平面之间的电连接。与平面互连相比,tsv需要大量的硅面积,这也给3D集成电路的设计带来了严峻的挑战。在本文中,我们提出了一种架构级的TSV计数优化方案,在不影响芯片性能的情况下最小化TSV计数。实验结果表明,我们能够将基于3D树的FPGA的TSV计数减少40%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Architecture level TSV count minimization methodology for 3D tree-based FPGA
The CMOS technology scaling has greatly improved the overall performance and density of Field Programmable Gate Array (FPGA), nonetheless the performance gap between FPGA and ASIC has remain very wide mainly due the programming overhead of FPGA. Three-Dimensional (3D) integration is a promising technology to reduce wire lengths. Through Silicon Vias (TSV) provide electrical connectivity between multiple active device planes in 3D integrated Circuits (ICs). TSVs require a significant silicon area compared to planar interconnects and also bring critical challenges to design of 3D ICs. In this paper we propose an architectural level TSV count optimization solution to minimize the TSV count without compromising the chip performance. The experimental results shows we are able to minimize 40% of TSV count in 3D Tree-based FPGA.
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