改进SiGe HBT结构以减少寄生屏障的影响

E. Abiri, M. Salehi, M. Shahraki, Zahra Mehrjoo
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引用次数: 0

摘要

研究了一种n-p-n SiGe异质结双极晶体管(HBT)。该晶体管的发射极和集电极由硅材料构成,锗掺杂剂在基极区线性扩散。锗掺杂剂的加入使晶体管基极-发射极结产生寄生势垒。这种结构降低了屏障效应。在该模型中,选择合适的掺杂剂结构可以提高集电极电流密度
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Reformation of an SiGe HBT structure for reducing the effect of parasitic barriers
In this paper, an n-p-n SiGe heterojunction bipolar transistor (HBT) is investigated. The emitter and collector of this transistor are made up of silicon, and germanium dopant is linearly diffused in the base region. Adding germanium dopant causes the formation of parasitic barriers in base-emitter junction of transistor. The barrier effects are reduced by this structure. In this model, choosing the proper dopant structure, the collector current density can be increased
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