{"title":"改进SiGe HBT结构以减少寄生屏障的影响","authors":"E. Abiri, M. Salehi, M. Shahraki, Zahra Mehrjoo","doi":"10.1109/PACCS.2010.5627013","DOIUrl":null,"url":null,"abstract":"In this paper, an n-p-n SiGe heterojunction bipolar transistor (HBT) is investigated. The emitter and collector of this transistor are made up of silicon, and germanium dopant is linearly diffused in the base region. Adding germanium dopant causes the formation of parasitic barriers in base-emitter junction of transistor. The barrier effects are reduced by this structure. In this model, choosing the proper dopant structure, the collector current density can be increased","PeriodicalId":431294,"journal":{"name":"2010 Second Pacific-Asia Conference on Circuits, Communications and System","volume":"21 7-8","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-11-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Reformation of an SiGe HBT structure for reducing the effect of parasitic barriers\",\"authors\":\"E. Abiri, M. Salehi, M. Shahraki, Zahra Mehrjoo\",\"doi\":\"10.1109/PACCS.2010.5627013\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, an n-p-n SiGe heterojunction bipolar transistor (HBT) is investigated. The emitter and collector of this transistor are made up of silicon, and germanium dopant is linearly diffused in the base region. Adding germanium dopant causes the formation of parasitic barriers in base-emitter junction of transistor. The barrier effects are reduced by this structure. In this model, choosing the proper dopant structure, the collector current density can be increased\",\"PeriodicalId\":431294,\"journal\":{\"name\":\"2010 Second Pacific-Asia Conference on Circuits, Communications and System\",\"volume\":\"21 7-8\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-11-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 Second Pacific-Asia Conference on Circuits, Communications and System\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/PACCS.2010.5627013\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 Second Pacific-Asia Conference on Circuits, Communications and System","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PACCS.2010.5627013","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Reformation of an SiGe HBT structure for reducing the effect of parasitic barriers
In this paper, an n-p-n SiGe heterojunction bipolar transistor (HBT) is investigated. The emitter and collector of this transistor are made up of silicon, and germanium dopant is linearly diffused in the base region. Adding germanium dopant causes the formation of parasitic barriers in base-emitter junction of transistor. The barrier effects are reduced by this structure. In this model, choosing the proper dopant structure, the collector current density can be increased