利用表面阻抗成像技术检测分子

K. Foley, X. Shan, Yuyuan Tian
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引用次数: 1

摘要

本文介绍了一种基于局部表面电荷密度影响表面等离子体共振(SPR)测量的表面阻抗成像技术。捕获整个表面的三幅图像:直流稳态图像、交流强度图像和交流相位图像。直流图像给出了厚度的标准SPR信息。交流强度和相位图像显示与表面阻抗相关的信息。这允许由电化学电位调制产生的表面电荷调制进行光学成像。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Detecting molecules using a surface impedance imaging technique
We demonstrate here a surface impedance imaging technique based on the local surface charge density influencing the surface plasmon resonance (SPR) measurement. Three images are captured of the entire surface: a DC steady-state image, an AC intensity image and an AC phase image. The DC image gives the standard SPR information on thickness. The AC intensity and phase images display information related to the surface impedance. This allows for the surface charge modulation created by the electrochemical potential modulation to be imaged optically.
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