{"title":"关于绝缘体体积电导率的测量","authors":"R. Coelho","doi":"10.1109/CEIDP.1999.804621","DOIUrl":null,"url":null,"abstract":"An improved technique using three-electrode systems for measuring the d.c. conductivity of solid insulators is described and discussed. Giving not only the volume conductivity of the sample under test, but also any contribution from edge effects and/or leakage across the sample holder, the method should be both simple and liable.","PeriodicalId":267509,"journal":{"name":"1999 Annual Report Conference on Electrical Insulation and Dielectric Phenomena (Cat. No.99CH36319)","volume":"38 9-10","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"On the measurement of the volume conductivity of insulators\",\"authors\":\"R. Coelho\",\"doi\":\"10.1109/CEIDP.1999.804621\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An improved technique using three-electrode systems for measuring the d.c. conductivity of solid insulators is described and discussed. Giving not only the volume conductivity of the sample under test, but also any contribution from edge effects and/or leakage across the sample holder, the method should be both simple and liable.\",\"PeriodicalId\":267509,\"journal\":{\"name\":\"1999 Annual Report Conference on Electrical Insulation and Dielectric Phenomena (Cat. No.99CH36319)\",\"volume\":\"38 9-10\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1999-10-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1999 Annual Report Conference on Electrical Insulation and Dielectric Phenomena (Cat. No.99CH36319)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CEIDP.1999.804621\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1999 Annual Report Conference on Electrical Insulation and Dielectric Phenomena (Cat. No.99CH36319)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CEIDP.1999.804621","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
On the measurement of the volume conductivity of insulators
An improved technique using three-electrode systems for measuring the d.c. conductivity of solid insulators is described and discussed. Giving not only the volume conductivity of the sample under test, but also any contribution from edge effects and/or leakage across the sample holder, the method should be both simple and liable.