Antonios Pavlidis, M. Louërat, E. Faehn, Anand Kumar, H. Stratigopoulos
{"title":"基于对称的A/M-S BIST (SymBIST):在SAR ADC IP上的演示","authors":"Antonios Pavlidis, M. Louërat, E. Faehn, Anand Kumar, H. Stratigopoulos","doi":"10.23919/DATE48585.2020.9116189","DOIUrl":null,"url":null,"abstract":"In this paper, we propose a defect-oriented Built-In Self-Test (BIST) paradigm for analog and mixed-signal (A/MS) Integrated Circuits (ICs), called symmetry-based BIST (Sym-BIST). SymBIST exploits inherent symmetries into the design to generate invariances that should hold true only in defect-free operation. Violation of any of these invariances points to defect detection. We demonstrate SymBIST on a 65nm 10-bit Successive Approximation Register (SAR) Analog-to-Digital Converter (ADC) IP by ST Microelectronics.","PeriodicalId":289525,"journal":{"name":"2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"10 3","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Symmetry-based A/M-S BIST (SymBIST): Demonstration on a SAR ADC IP\",\"authors\":\"Antonios Pavlidis, M. Louërat, E. Faehn, Anand Kumar, H. Stratigopoulos\",\"doi\":\"10.23919/DATE48585.2020.9116189\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, we propose a defect-oriented Built-In Self-Test (BIST) paradigm for analog and mixed-signal (A/MS) Integrated Circuits (ICs), called symmetry-based BIST (Sym-BIST). SymBIST exploits inherent symmetries into the design to generate invariances that should hold true only in defect-free operation. Violation of any of these invariances points to defect detection. We demonstrate SymBIST on a 65nm 10-bit Successive Approximation Register (SAR) Analog-to-Digital Converter (ADC) IP by ST Microelectronics.\",\"PeriodicalId\":289525,\"journal\":{\"name\":\"2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)\",\"volume\":\"10 3\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-03-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.23919/DATE48585.2020.9116189\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/DATE48585.2020.9116189","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Symmetry-based A/M-S BIST (SymBIST): Demonstration on a SAR ADC IP
In this paper, we propose a defect-oriented Built-In Self-Test (BIST) paradigm for analog and mixed-signal (A/MS) Integrated Circuits (ICs), called symmetry-based BIST (Sym-BIST). SymBIST exploits inherent symmetries into the design to generate invariances that should hold true only in defect-free operation. Violation of any of these invariances points to defect detection. We demonstrate SymBIST on a 65nm 10-bit Successive Approximation Register (SAR) Analog-to-Digital Converter (ADC) IP by ST Microelectronics.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
