缩短量产时间和上市时间:硅调试和诊断是答案吗?

Proceedings 20th IEEE VLSI Test Symposium (VTS 2002) Pub Date : 2002-04-28 DOI:10.1109/VTS.2002.1011178

F. Muradali, M. Ricchetti, B. Vermeulen, B. Dervisoglu, B. Gottlieb, B. Koenemann, C. J. Clark

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引用次数: 0

摘要

半导体技术和设计自动化的进步，加上市场竞争的加剧，促使工程师们以更短的开发周期实现更高水平的集成。因此，验证和分析成为复杂系统及时设计的主要瓶颈。小组成员和观众将探讨硅调试及其对设计周期的影响。

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Reducing time to volume and time to market: Is silicon debug and diagnosis the answer?

Advances in semiconductor technology and design automation, together with increased market competition, have driven engineers to achieve higher levels of integration, with shortened development cycles. Consequently, verification and analysis are becoming a major bottleneck for timely design of complex systems. The panelists and the audience will explore silicon debug and its impact on the design cycle.

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Proceedings 20th IEEE VLSI Test Symposium (VTS 2002)

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