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高工作温度下的可靠性物理和电子设计

HITEN 99. Third European Conference on High Temperature Electronics. (IEEE Cat. No.99EX372) Pub Date : 1999-07-07 DOI:10.1109/HITEN.1999.827476
B. Peat
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引用次数: 0

摘要

提供了作者会议演示的幻灯片集。
本文章由计算机程序翻译，如有差异，请以英文原文为准。
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Reliability physics and electronics design for high operating temperatures
The collection of slides from the author's conference presentation is provided.
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来源期刊
HITEN 99. Third European Conference on High Temperature Electronics. (IEEE Cat. No.99EX372)
HITEN 99. Third European Conference on High Temperature Electronics. (IEEE Cat. No.99EX372)
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