{"title":"太阳能组件内部缺陷对其电气特性的影响","authors":"W. Yongqing, Cai Ailing, Sun Rong-xia, Guo Yukun","doi":"10.1109/IPFA.2009.5232550","DOIUrl":null,"url":null,"abstract":"Combined with the corresponding infrared images and experimental verification, the paper analyzed impacts on the electrical property of modules caused by the internal defects aiming at the output characteristic curves measured by the Solar Simulator.","PeriodicalId":210619,"journal":{"name":"2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits","volume":"32 4","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"The impact on electric characteristics of solar modules by its internal defects\",\"authors\":\"W. Yongqing, Cai Ailing, Sun Rong-xia, Guo Yukun\",\"doi\":\"10.1109/IPFA.2009.5232550\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Combined with the corresponding infrared images and experimental verification, the paper analyzed impacts on the electrical property of modules caused by the internal defects aiming at the output characteristic curves measured by the Solar Simulator.\",\"PeriodicalId\":210619,\"journal\":{\"name\":\"2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits\",\"volume\":\"32 4\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-07-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IPFA.2009.5232550\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IPFA.2009.5232550","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The impact on electric characteristics of solar modules by its internal defects
Combined with the corresponding infrared images and experimental verification, the paper analyzed impacts on the electrical property of modules caused by the internal defects aiming at the output characteristic curves measured by the Solar Simulator.