X. Jordà, X. Perpiñà, M. Vellvehí, W. Hertog, M. Peralvarez, J. Carreras
{"title":"不同表征参数对改造灯泡LED板热模型精度的影响","authors":"X. Jordà, X. Perpiñà, M. Vellvehí, W. Hertog, M. Peralvarez, J. Carreras","doi":"10.1109/THERMINIC.2013.6675207","DOIUrl":null,"url":null,"abstract":"This paper analyses the influence of several error sources on the thermal impedance curve measurement of multi-LED boards designed for retrofit Solid State Lighting bulbs, using standard instrumentation and simple auxiliary circuitry. The obtained thermal impedance curve is then used for the extraction of compact thermal models, suitable for the prediction of the LED junction temperature under working conditions and for system-level simulation. The main results have shown the relevance of the correct board backside reference temperature measurement and the errors associated to the radiant flux estimation.","PeriodicalId":369128,"journal":{"name":"19th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)","volume":"604 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-12-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Influence of different characterization parameters on the accuracy of LED board thermal models for retrofit bulbs\",\"authors\":\"X. Jordà, X. Perpiñà, M. Vellvehí, W. Hertog, M. Peralvarez, J. Carreras\",\"doi\":\"10.1109/THERMINIC.2013.6675207\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper analyses the influence of several error sources on the thermal impedance curve measurement of multi-LED boards designed for retrofit Solid State Lighting bulbs, using standard instrumentation and simple auxiliary circuitry. The obtained thermal impedance curve is then used for the extraction of compact thermal models, suitable for the prediction of the LED junction temperature under working conditions and for system-level simulation. The main results have shown the relevance of the correct board backside reference temperature measurement and the errors associated to the radiant flux estimation.\",\"PeriodicalId\":369128,\"journal\":{\"name\":\"19th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)\",\"volume\":\"604 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-12-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"19th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/THERMINIC.2013.6675207\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"19th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/THERMINIC.2013.6675207","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Influence of different characterization parameters on the accuracy of LED board thermal models for retrofit bulbs
This paper analyses the influence of several error sources on the thermal impedance curve measurement of multi-LED boards designed for retrofit Solid State Lighting bulbs, using standard instrumentation and simple auxiliary circuitry. The obtained thermal impedance curve is then used for the extraction of compact thermal models, suitable for the prediction of the LED junction temperature under working conditions and for system-level simulation. The main results have shown the relevance of the correct board backside reference temperature measurement and the errors associated to the radiant flux estimation.