矩形和圆形贴片反射阵元的反射相位特性

V. Lingasamy, K. Selvan, S. Rengarajan
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引用次数: 3

摘要

在反射天线的设计中,计算单晶片的反射相位是至关重要的。本文提出了一种计算圆片反射相位的理论方法。这是通过改编已经发表的矩形补丁元素的工作来完成的。对不同厚度和介电常数的基片在X波段的反射相位估计与模拟值进行了比较。通过比较可以理解,该方法适用于具有任何介电常数的薄衬底和具有高介电常数的中厚衬底。当然,这个观察结果与对矩形斑块的观察结果是一致的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
On the reflection phase characteristics of rectangular and circular patch reflectarray elements
In reflectarray design, computation of the reflection phase of unit cells is of prime importance. In this paper, a theoretical method to calculate the reflection phase of circular patches is reported. This is done by adapting an already published work for rectangular patch elements. The estimated reflection phases for circular patches in X band are compared with simulated values for substrates of varying thickness and dielectric constant. The comparison leads to the understanding that the method works satisfactorily for thin substrates with any dielectric constant and for moderately thick substrates with high dielectric constant. This observation is, of course, consistent with that made for the rectangular patch.
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