Yoshiki Saito, T. Shirai, Takuro Nakamura, T. Nishimura, Y. Hasegawa, S. Tsutsumi, Toshihiro Kashima, M. Nakata, S. Takeda, K. Usami, H. Amano
{"title":"采用细粒度功率门控技术降低粗粒度动态可重构处理器阵列的泄漏功率","authors":"Yoshiki Saito, T. Shirai, Takuro Nakamura, T. Nishimura, Y. Hasegawa, S. Tsutsumi, Toshihiro Kashima, M. Nakata, S. Takeda, K. Usami, H. Amano","doi":"10.1109/FPT.2008.4762410","DOIUrl":null,"url":null,"abstract":"One of the benefits of coarse grained dynamically reconfigurable processor array(DRPA) is its low dynamic power consumption by operating a number of processing elements(PE) in parallel with low clock frequency. However, in the future advanced processes, leakage power will occupy a considerable part of the total power consumption, and it may degrade the advantage of DRPAs. In order to reduce the leakage power, a fine grained Power Gating(PG) is applied to a DRPA, MuCCRA-2.32b, and leakage power and area overhead are measured. We evaluated the effect of two control modes; Pair and Unit Individual based on layout design and real applications. It appears that by applying PG for ALUs and SMUs in PEs individually, 48% of leakage power can be reduced with 9.0% of area overhead.","PeriodicalId":320925,"journal":{"name":"2008 International Conference on Field-Programmable Technology","volume":"121 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"21","resultStr":"{\"title\":\"Leakage power reduction for coarse grained dynamically reconfigurable processor arrays with fine grained Power Gating technique\",\"authors\":\"Yoshiki Saito, T. Shirai, Takuro Nakamura, T. Nishimura, Y. Hasegawa, S. Tsutsumi, Toshihiro Kashima, M. Nakata, S. Takeda, K. Usami, H. Amano\",\"doi\":\"10.1109/FPT.2008.4762410\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"One of the benefits of coarse grained dynamically reconfigurable processor array(DRPA) is its low dynamic power consumption by operating a number of processing elements(PE) in parallel with low clock frequency. However, in the future advanced processes, leakage power will occupy a considerable part of the total power consumption, and it may degrade the advantage of DRPAs. In order to reduce the leakage power, a fine grained Power Gating(PG) is applied to a DRPA, MuCCRA-2.32b, and leakage power and area overhead are measured. We evaluated the effect of two control modes; Pair and Unit Individual based on layout design and real applications. It appears that by applying PG for ALUs and SMUs in PEs individually, 48% of leakage power can be reduced with 9.0% of area overhead.\",\"PeriodicalId\":320925,\"journal\":{\"name\":\"2008 International Conference on Field-Programmable Technology\",\"volume\":\"121 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"21\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 International Conference on Field-Programmable Technology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/FPT.2008.4762410\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 International Conference on Field-Programmable Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/FPT.2008.4762410","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Leakage power reduction for coarse grained dynamically reconfigurable processor arrays with fine grained Power Gating technique
One of the benefits of coarse grained dynamically reconfigurable processor array(DRPA) is its low dynamic power consumption by operating a number of processing elements(PE) in parallel with low clock frequency. However, in the future advanced processes, leakage power will occupy a considerable part of the total power consumption, and it may degrade the advantage of DRPAs. In order to reduce the leakage power, a fine grained Power Gating(PG) is applied to a DRPA, MuCCRA-2.32b, and leakage power and area overhead are measured. We evaluated the effect of two control modes; Pair and Unit Individual based on layout design and real applications. It appears that by applying PG for ALUs and SMUs in PEs individually, 48% of leakage power can be reduced with 9.0% of area overhead.