氧化锌纳米线肖特基二极管的电学特性

Ahlem Rouis, N. Hizem, A. Kalboussi
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引用次数: 3

摘要

本文对肖特基Pt / ZnO纳米线二极管的I(V)和I(V- t)特性进行了深入分析。通过详细分析,提取了各种电参数和界面状态信息。通过电流-电压测量,确定了结构的势垒高度、理想系数、饱和电流和串联电阻等特性参数。室温下的理想系数(3.58)高于1,这可能是由于n-ZnO / p-Si异质结与Pt / ZnO纳米线串联的缘故。利用热离子发射模型计算的二极管势垒高度(0.65 eV)与理论预测值吻合较好。事实上,这两个由电流-电压I(V)特性得到的值表明Pt和纳米线ZnO之间存在界面态。为了证实这一观察结果,我们进行了测量C (V)。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Electrical characterizations of Schottky diode with zinc oxide nanowires
This paper presents an in-depth analysis of the I (V) and I(V-T) characteristics of the Schottky Pt / ZnO nanowire diode. Detailed analyzes were performed to extract the various electrical parameters and information on the interface states. The characteristic parameters of the structure such as barrier height, ideality factor, saturation current and series resistance were determined from the current-voltage measurement. The ideality factor (3.58) value at room temperature is higher than unity probably due to the presence of the n-ZnO / p-Si heterojunction in series with the Pt / ZnO nanowire. The value of the computed barrier height of the diode (0.65 eV) using the thermionic emission model is in good agreement with the theoretically predicted value. Indeed, these two values obtained by the current-voltage I(V) characteristics suggested the presence of interface states between the Pt and the nanowire ZnO. To confirm this observation, we carried out the measurement C (V).
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