利用图像分析方法表征纳米颗粒直径

Luis A. Jara-Lugo, Jesús Caro-Gutiérrez, F. F. González-Navarro, Mario A. Curiel Alvarez, Oscar M. Pérez Landeros, N. Nedev
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引用次数: 1

摘要

纳米粒子的自动检测、形状分析和尺寸估计的方法为材料科学评价提供了重要的定量支持。本文提出了一种基于图像分析的纳米颗粒直径自动表征方法。通过下加利福尼亚自治大学(Autonomous University of Baja California, UABC)的电子显微镜获得纳米粒子图像数据库,其他图像来自nanoComposix网页。首先,采用自适应维纳滤波(AWF)去除噪声,并采用对比度有限自适应直方图均衡化(CLAHE)作为增强步骤;在MATLAB编程环境下,比较了k -均值聚类(KMC)和自适应阈值分割(AT)两种分割方法。结果表明,KMC的均方误差为41.98,而AT的均方误差为172.11。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Nanoparticles diameter characterization using image analysis methodology
Methods for automatic nanoparticles detection, shape analysis and size estimation have obtained importance to provide quantitative support that gives significant information for evaluation in Materials Science. This paper presents a methodology for automatic nanoparticles diameter characterization by image analysis. A nanoparticles images database was obtained by means of an electron microscope in the Autonomous University of Baja California (UABC) and other images were obtained from nanoComposix web page. Firstly, an adaptive Wiener Filtering Method (AWF) was carried out to remove noise and Contrast Limited Adaptive Histogram Equalization Method (CLAHE) as enhancement step. Later two segmentation methods were compared: K-means Clustering (KMC) and Adaptive Thresholding (AT), both with MATLAB programming environment. Results showed that KMC performed better than AT i.e., a KMC mean square error 41.98 vs AT MSE of 172.11.
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