M. Garg, A. Basu, T. C. Wilson, D. Banerji, J. Majithia
{"title":"一种新的VLSI系统测试调度算法","authors":"M. Garg, A. Basu, T. C. Wilson, D. Banerji, J. Majithia","doi":"10.1109/ISVD.1991.185108","DOIUrl":null,"url":null,"abstract":"Presents a new test scheduling algorithm based on a new heuristic approach. A new concept of time zone tree has been proposed and the algorithm builds up the tree based on a heuristic cost function. The performance of the algorithm has been compared with existing algorithms and it demonstrates encouraging results.<<ETX>>","PeriodicalId":183602,"journal":{"name":"[1991] Proceedings. Fourth CSI/IEEE International Symposium on VLSI Design","volume":"50 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-01-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":"{\"title\":\"A new test scheduling algorithm for VLSI systems\",\"authors\":\"M. Garg, A. Basu, T. C. Wilson, D. Banerji, J. Majithia\",\"doi\":\"10.1109/ISVD.1991.185108\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Presents a new test scheduling algorithm based on a new heuristic approach. A new concept of time zone tree has been proposed and the algorithm builds up the tree based on a heuristic cost function. The performance of the algorithm has been compared with existing algorithms and it demonstrates encouraging results.<<ETX>>\",\"PeriodicalId\":183602,\"journal\":{\"name\":\"[1991] Proceedings. Fourth CSI/IEEE International Symposium on VLSI Design\",\"volume\":\"50 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-01-04\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"11\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"[1991] Proceedings. Fourth CSI/IEEE International Symposium on VLSI Design\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISVD.1991.185108\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"[1991] Proceedings. Fourth CSI/IEEE International Symposium on VLSI Design","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISVD.1991.185108","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Presents a new test scheduling algorithm based on a new heuristic approach. A new concept of time zone tree has been proposed and the algorithm builds up the tree based on a heuristic cost function. The performance of the algorithm has been compared with existing algorithms and it demonstrates encouraging results.<>