{"title":"隧道二极管的快速三维MC模拟器","authors":"M. Wagner, H. Mizuta, K. Nakazato","doi":"10.1109/SISPAD.2000.871199","DOIUrl":null,"url":null,"abstract":"A fast simulator is presented for 3D vertical tunneling devices with lateral confinement and gates. The tunneling current across each barrier is calculated using a combination of 3D ray tracing, Monte Carlo ensemble averaging, and a multi-grid Poisson solver, until self-consistency of the current is achieved.","PeriodicalId":132609,"journal":{"name":"2000 International Conference on Simulation Semiconductor Processes and Devices (Cat. No.00TH8502)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-09-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"A fast three-dimensional MC simulator for tunneling diodes\",\"authors\":\"M. Wagner, H. Mizuta, K. Nakazato\",\"doi\":\"10.1109/SISPAD.2000.871199\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A fast simulator is presented for 3D vertical tunneling devices with lateral confinement and gates. The tunneling current across each barrier is calculated using a combination of 3D ray tracing, Monte Carlo ensemble averaging, and a multi-grid Poisson solver, until self-consistency of the current is achieved.\",\"PeriodicalId\":132609,\"journal\":{\"name\":\"2000 International Conference on Simulation Semiconductor Processes and Devices (Cat. No.00TH8502)\",\"volume\":\"12 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-09-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2000 International Conference on Simulation Semiconductor Processes and Devices (Cat. No.00TH8502)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SISPAD.2000.871199\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2000 International Conference on Simulation Semiconductor Processes and Devices (Cat. No.00TH8502)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SISPAD.2000.871199","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A fast three-dimensional MC simulator for tunneling diodes
A fast simulator is presented for 3D vertical tunneling devices with lateral confinement and gates. The tunneling current across each barrier is calculated using a combination of 3D ray tracing, Monte Carlo ensemble averaging, and a multi-grid Poisson solver, until self-consistency of the current is achieved.