多芯片计算机扫描路径测试

1987 IEEE International Solid-State Circuits Conference. Digest of Technical Papers Pub Date : 1900-01-01 DOI:10.1109/ISSCC.1987.1157190

R. Schuchard, D. Weiss

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引用次数: 5

摘要

研制了32b多芯片VLSI计算机的片上测试支持电路。测试支架由一个测试PLA和一个45MHz诊断接口端口组成，该端口可复用多达16个串行扫描路径。虽然所需的芯片面积和功耗不到10%，但它支持从芯片到系统级的测试、表征和诊断。

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Scan path testing of a multichip computer

On-chip test support circuitry has been developed for a 32b multichip VLSI computer. The test support consists of a test PLA and a 45MHz diagnostic interface port that multiplexes up to 16 serial scan paths. While requiring less than 10% of chip area and power, it supports testing, characterization and diagnosis from chip to system level.

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1987 IEEE International Solid-State Circuits Conference. Digest of Technical Papers

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