基于模型的产品数量控制

Seventeenth IEEE/CPMT International Electronics Manufacturing Technology Symposium. 'Manufacturing Technologies - Present and Future' Pub Date : 1995-10-02 DOI:10.1109/IEMT.1995.526192

V. Ramakrishnan, D. Walker

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引用次数: 2

摘要

提出了一种用于集成电路产品质量控制的响应面模型的建立方法。采用基于仿真的方法建立模型。这项工作的重点是基于在线、原位和晶圆级电气测试(WET)来控制每个产品的晶圆启动数量。实时决策取决于对特定性能的需求。

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Model-based product quantity control

A methodology for building Response Surface Models (RSM) for product quantity control of integrated circuits is presented. A simulation based approach is used to build the models. The work focuses on controlling the number of wafer starts devoted to each product based on in-line, in-situ and Wafer-level Electric Tests (WET). Real-time decisions are made depending on the demand for a particular performance bin.

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来源期刊

Seventeenth IEEE/CPMT International Electronics Manufacturing Technology Symposium. 'Manufacturing Technologies - Present and Future'

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