高速环形发生器和测试数据压缩器[逻辑IC测试]

Proceedings. 21st VLSI Test Symposium, 2003. Pub Date : 2003-04-27 DOI:10.1109/VTEST.2003.1197633

Grzegorz Mrugalski, J. Rajski, J. Tyszer

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引用次数: 29

摘要

本文提出了一种新的测试模式生成器和压缩器的高度模块化体系结构。与外部反馈lfsr、内部反馈lfsr和元胞自动机相比，这种结构具有更少的逻辑层次、更小的扇出、更小的面积和更快的运行速度，所有这些都实现相同的特征多项式。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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High speed ring generators and compactors of test data [logic IC test]

This paper presents a new highly modular architecture of generators and compactors of test patterns. This structure has fewer levels of logic, smaller fan-out, reduced area, and operates at faster speed than external feedback LFSRs, internal feedback LFSRs, and cellular automata, all implementing the same characteristic polynomial.

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来源期刊

Proceedings. 21st VLSI Test Symposium, 2003.

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