DFT技术快速表征流水线adc的闪偏

2015 28th International Conference on VLSI Design Pub Date : 2015-02-05 DOI:10.1109/VLSID.2015.69

P. Nair, N. Viswanathan

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引用次数: 1

摘要

本文提出了一种新的DFT块及其相关方法来表征流水线ADC中使用的粗闪光偏移量。在非sha架构中，由于动态偏移的存在，测量跨输入频率的闪光偏移变得很重要。通过添加特殊的数据输出模式，所提出的DFT技术可以使用adc的标准单音测试和测量设置，在PVT上快速表征闪光偏移。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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DFT Technique for Quick Characterization of Flash Offset in Pipeline ADCs

This paper proposes a novel DFT block and associated method for characterizing the offsets of the coarse flash used in a pipelined ADC. In non-SHA architecture, due to the presence of dynamic offset, measuring flash offsets across input frequency becomes important. By adding special data output modes, the proposed DFT technique allows speedy characterization of flash offset, across PVT, using the standard single-tone test and measurement setup for the ADCs.

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2015 28th International Conference on VLSI Design

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