利用单端口TDR测量对传输线频率相关特性阻抗的鲁棒提取

IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No. 01TH8565) Pub Date : 2001-10-29 DOI:10.1109/EPEP.2001.967624

Woopoung Kim, Seock-Hee Lee, Madhavan Swaminathan, Rao Tummala

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引用次数: 8

摘要

本文讨论了一种从时域反射(TDR)测量中提取频率相关特性阻抗的方法，该方法使用开路、短线、负载和短线校准。利用该方法成功地捕获了传输线的频率依赖行为。采用该方法测量了两种类型的传输线，即印刷线路板(PWB)中的粗金属传输线和MCM-L技术中的细传输线。

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Robust extraction of the frequency-dependent characteristic impedance of transmission lines using one-port TDR measurements

This paper discusses a method for extracting the frequency dependent characteristic impedance of transmission lines from Time Domain Reflectometry (TDR) measurements using an Open, Short, Load, and Shortline calibration. The frequency dependent behavior of transmission lines was successfully captured using this method. Two types of transmission lines were measured using this method namely, thick metal transmission lines in Printed Wiring Board (PWB) and thin transmission lines in MCM-L technology.

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IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No. 01TH8565)

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