利用八叉树编码检测结构缺陷

Álvaro Gómez-Pau, L. Balado, J. Figueras
{"title":"利用八叉树编码检测结构缺陷","authors":"Álvaro Gómez-Pau, L. Balado, J. Figueras","doi":"10.1109/DCIS.2017.8311625","DOIUrl":null,"url":null,"abstract":"Testing of analogue and M-S circuits using octree encoding in alternate measurements space has been shown effective to detect parametric failures. In this paper, the analysis of the viability to use octree encoding to detect catastrophic faults has been explored. In addition to the classical short and open defects, the class of controlling open faults causing unpredictable behaviour have been considered. In this category, fall some opens causing floating gate defects where the high impedance node gets a voltage imposed by the capacitive coupling of surrounding lines and possible leakage currents to the floating node. The method has been applied to a Biquad filter where a wide class of catastrophic defects (shorts, path opens and floating opens) have been injected. Parametric and catastrophic failures were detected using the same alternate test procedure achieving significant savings in test application time. The results show that with a simple octree based on two indirect measures detectability was guaranteed forall shorts, and path opens. A significant number of floating gate opens is also detectable. The floating gate defects escaping assured detection would be those in which the floating gate during test excitation produces voltages at the open gate(s) similar to the voltage of the non-defective circuit.","PeriodicalId":136788,"journal":{"name":"2017 32nd Conference on Design of Circuits and Integrated Systems (DCIS)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Detectability of structural defects using octree encoding\",\"authors\":\"Álvaro Gómez-Pau, L. Balado, J. Figueras\",\"doi\":\"10.1109/DCIS.2017.8311625\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Testing of analogue and M-S circuits using octree encoding in alternate measurements space has been shown effective to detect parametric failures. In this paper, the analysis of the viability to use octree encoding to detect catastrophic faults has been explored. In addition to the classical short and open defects, the class of controlling open faults causing unpredictable behaviour have been considered. In this category, fall some opens causing floating gate defects where the high impedance node gets a voltage imposed by the capacitive coupling of surrounding lines and possible leakage currents to the floating node. The method has been applied to a Biquad filter where a wide class of catastrophic defects (shorts, path opens and floating opens) have been injected. Parametric and catastrophic failures were detected using the same alternate test procedure achieving significant savings in test application time. The results show that with a simple octree based on two indirect measures detectability was guaranteed forall shorts, and path opens. A significant number of floating gate opens is also detectable. The floating gate defects escaping assured detection would be those in which the floating gate during test excitation produces voltages at the open gate(s) similar to the voltage of the non-defective circuit.\",\"PeriodicalId\":136788,\"journal\":{\"name\":\"2017 32nd Conference on Design of Circuits and Integrated Systems (DCIS)\",\"volume\":\"10 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 32nd Conference on Design of Circuits and Integrated Systems (DCIS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DCIS.2017.8311625\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 32nd Conference on Design of Circuits and Integrated Systems (DCIS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DCIS.2017.8311625","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

在交替测量空间中使用八叉树编码测试模拟和M-S电路已被证明可以有效地检测参数故障。本文对利用八叉树编码检测灾难性故障的可行性进行了分析。除了经典的短缺陷和开放缺陷外,还考虑了控制导致不可预测行为的开放故障的类别。在这一类中,在高阻抗节点得到由周围线路的电容耦合施加的电压和可能的泄漏电流到浮动节点的情况下,落下一些打开导致浮栅缺陷。该方法已应用于Biquad滤波器,其中注入了各种灾难性缺陷(短路,路径打开和浮动打开)。使用相同的替代测试过程检测参数和灾难性故障,从而大大节省了测试应用时间。结果表明,基于两个间接测度的简单八叉树保证了所有短路和路径开度的可检测性。还可以检测到相当数量的浮动门打开。逃过保证检测的浮栅缺陷将是那些在试验激励期间浮栅在开栅处产生与无缺陷电路电压相似的电压的缺陷。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Detectability of structural defects using octree encoding
Testing of analogue and M-S circuits using octree encoding in alternate measurements space has been shown effective to detect parametric failures. In this paper, the analysis of the viability to use octree encoding to detect catastrophic faults has been explored. In addition to the classical short and open defects, the class of controlling open faults causing unpredictable behaviour have been considered. In this category, fall some opens causing floating gate defects where the high impedance node gets a voltage imposed by the capacitive coupling of surrounding lines and possible leakage currents to the floating node. The method has been applied to a Biquad filter where a wide class of catastrophic defects (shorts, path opens and floating opens) have been injected. Parametric and catastrophic failures were detected using the same alternate test procedure achieving significant savings in test application time. The results show that with a simple octree based on two indirect measures detectability was guaranteed forall shorts, and path opens. A significant number of floating gate opens is also detectable. The floating gate defects escaping assured detection would be those in which the floating gate during test excitation produces voltages at the open gate(s) similar to the voltage of the non-defective circuit.
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