{"title":"耦合微带线电磁干扰的低频SPICE模型","authors":"I. Wuyts, D. De Zutter","doi":"10.1109/ISEMC.1994.385662","DOIUrl":null,"url":null,"abstract":"A low-frequency circuit model (typically a SPICE model) is derived to calculate the voltages and currents caused by the incidence of a low-frequency uniform plane wave on a multilayered microstrip structure. A new analysis method is demonstrated, based on a low-frequency series expansion rather than on the direct integration of Maxwell's equations.<<ETX>>","PeriodicalId":154914,"journal":{"name":"Proceedings of IEEE Symposium on Electromagnetic Compatibility","volume":"31 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-08-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Low-frequency SPICE model for EMC-disturbances on coupled microstrip lines\",\"authors\":\"I. Wuyts, D. De Zutter\",\"doi\":\"10.1109/ISEMC.1994.385662\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A low-frequency circuit model (typically a SPICE model) is derived to calculate the voltages and currents caused by the incidence of a low-frequency uniform plane wave on a multilayered microstrip structure. A new analysis method is demonstrated, based on a low-frequency series expansion rather than on the direct integration of Maxwell's equations.<<ETX>>\",\"PeriodicalId\":154914,\"journal\":{\"name\":\"Proceedings of IEEE Symposium on Electromagnetic Compatibility\",\"volume\":\"31 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-08-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of IEEE Symposium on Electromagnetic Compatibility\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.1994.385662\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of IEEE Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.1994.385662","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Low-frequency SPICE model for EMC-disturbances on coupled microstrip lines
A low-frequency circuit model (typically a SPICE model) is derived to calculate the voltages and currents caused by the incidence of a low-frequency uniform plane wave on a multilayered microstrip structure. A new analysis method is demonstrated, based on a low-frequency series expansion rather than on the direct integration of Maxwell's equations.<>