图形核仿真中最坏情况下功率输出噪声的测量和最坏情况电流的构建

F. Tan
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引用次数: 3

摘要

在最坏的情况下,图形核心的功率传递噪声是图形芯片性能的一个主要指标。由于在预硅设计阶段不容易预测最坏情况下的电流刺激,因此设计良好的图形核心输电网络(PDN)在技术上是一个难点。很多时候,当图形基准测试软件在硅后验证期间运行时,会观察到最坏情况下的功率传递噪声。在这种情况下,除非在早期设计阶段放置许多额外的电容器占位符,否则纠正电源传输噪声问题为时已晚。为了智能优化图形核心供电网络设计和确定合适的去耦电容数量,本文提出了一种建立工作平台捕捉最坏情况下供电噪声的方法;然后用Thevenin定理重建最坏情况下的供电电流。测量是基于实际的游戏应用,而不是通过数百万个逻辑测试向量产生的工程特殊刺激。该方法实用、直接、快捷,不需要庞大的计算资源;或者技术娴熟的逻辑设计师设计算法来构建刺激。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Measurement of worst-case power delivery noise and construction of worst case current for graphics core simulation
Worst case graphics core power delivery noise is a major indicator of graphics chip performance. The design of good graphics core power delivery network (PDN) is technically difficult because it is not easy to predict a worst case current stimulus during pre-silicon design stage. Many times, the worst case power delivery noise is observed when graphics benchmark software is run during post-silicon validation. At times like this, it is too late to rectify the power delivery noise issue unless many extra capacitor placeholders are placed during early design stage. To intelligently optimize the graphics core power delivery network design and determining the right amount of decoupling capacitors, this paper suggests an approach that setup a working platform to capture the worst case power delivery noise; and later re-construct the worst case power delivery current using Thevenin's Theorem. The measurement is based on actual gaming application instead of engineering a special stimulus that is generated thru millions of logic test-vectors. This approach is practical, direct and quick, and does not need huge computing resources; or technically skilled logic designers to design algorithms to build the stimulus.
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