{"title":"逻辑电路中可重构低功耗并发错误检测","authors":"S. Almukhaizim, Sara Bunian, O. Sinanoglu","doi":"10.1109/IDT.2010.5724415","DOIUrl":null,"url":null,"abstract":"Concurrent Error Detection (CED) methods are commonly employed to provide some level of error detection capability at the cost of some area and power overhead. In many applications, however, the error detection capability must be reconfigured dynamically, in order to adapt to the available power budget, criticality of the processed data, a thermal-safe schedule, etc. In this work, we propose a reconfigurable duplication-based CED infrastructure for logic circuits. The key idea is to enable/disable the operation of the duplicate circuit according to a set of control conditions. When CED is disabled, the inputs to the duplicate circuit retain their previous values (i.e., reduction in power dissipation via elimination of switching activity), yet errors are not detected (i.e., reduction in CED coverage). Experimental results using judicious and random selection of control conditions yield the same end-result; power dissipation is commensurate with CED coverage. Therefore, LFSR structures can be used to easily generate and reconfigure conditions, enabling their dynamic adjustment to adapt to the power constraints of the system.","PeriodicalId":153183,"journal":{"name":"2010 5th International Design and Test Workshop","volume":"17 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-07-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Reconfigurable low-power Concurrent Error Detection in logic circuits\",\"authors\":\"S. Almukhaizim, Sara Bunian, O. Sinanoglu\",\"doi\":\"10.1109/IDT.2010.5724415\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Concurrent Error Detection (CED) methods are commonly employed to provide some level of error detection capability at the cost of some area and power overhead. In many applications, however, the error detection capability must be reconfigured dynamically, in order to adapt to the available power budget, criticality of the processed data, a thermal-safe schedule, etc. In this work, we propose a reconfigurable duplication-based CED infrastructure for logic circuits. The key idea is to enable/disable the operation of the duplicate circuit according to a set of control conditions. When CED is disabled, the inputs to the duplicate circuit retain their previous values (i.e., reduction in power dissipation via elimination of switching activity), yet errors are not detected (i.e., reduction in CED coverage). Experimental results using judicious and random selection of control conditions yield the same end-result; power dissipation is commensurate with CED coverage. Therefore, LFSR structures can be used to easily generate and reconfigure conditions, enabling their dynamic adjustment to adapt to the power constraints of the system.\",\"PeriodicalId\":153183,\"journal\":{\"name\":\"2010 5th International Design and Test Workshop\",\"volume\":\"17 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-07-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 5th International Design and Test Workshop\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IDT.2010.5724415\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 5th International Design and Test Workshop","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IDT.2010.5724415","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Reconfigurable low-power Concurrent Error Detection in logic circuits
Concurrent Error Detection (CED) methods are commonly employed to provide some level of error detection capability at the cost of some area and power overhead. In many applications, however, the error detection capability must be reconfigured dynamically, in order to adapt to the available power budget, criticality of the processed data, a thermal-safe schedule, etc. In this work, we propose a reconfigurable duplication-based CED infrastructure for logic circuits. The key idea is to enable/disable the operation of the duplicate circuit according to a set of control conditions. When CED is disabled, the inputs to the duplicate circuit retain their previous values (i.e., reduction in power dissipation via elimination of switching activity), yet errors are not detected (i.e., reduction in CED coverage). Experimental results using judicious and random selection of control conditions yield the same end-result; power dissipation is commensurate with CED coverage. Therefore, LFSR structures can be used to easily generate and reconfigure conditions, enabling their dynamic adjustment to adapt to the power constraints of the system.