Masaaki Ito, Souichi Katagiri, H. Yamanashi, Eiichi Seya, T. Ogawa, H. Oizumi, T. Terasawa
{"title":"EUV光刻的光学技术","authors":"Masaaki Ito, Souichi Katagiri, H. Yamanashi, Eiichi Seya, T. Ogawa, H. Oizumi, T. Terasawa","doi":"10.1364/eul.1996.eww9","DOIUrl":null,"url":null,"abstract":"A high-throughput optical system that has a bouncing number of only four, including a reflective mask, was designed. The illumination system is comprised of a single tilted-ellipsoidal mirror, that is suitable for a two-aspherical-mirror ring-field imaging system. A prototype optical system was evaluated using synchrotron radiation at the Photon Factory. The experimental results combined with calculations have indicated that a throughput of 15 to 20 wafers/h can be obtained by using the optical system in combination with a compact storage ring. In addition, 0.12-μm line-and-space patterns were delineated in parts of the ring field. The use of alternating and attenuated reflective phase-shifting masks is also discussed to enhance the resolution of EUV lithography.","PeriodicalId":201185,"journal":{"name":"Extreme Ultraviolet Lithography (TOPS)","volume":"35 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Optical Technology for EUV Lithography\",\"authors\":\"Masaaki Ito, Souichi Katagiri, H. Yamanashi, Eiichi Seya, T. Ogawa, H. Oizumi, T. Terasawa\",\"doi\":\"10.1364/eul.1996.eww9\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A high-throughput optical system that has a bouncing number of only four, including a reflective mask, was designed. The illumination system is comprised of a single tilted-ellipsoidal mirror, that is suitable for a two-aspherical-mirror ring-field imaging system. A prototype optical system was evaluated using synchrotron radiation at the Photon Factory. The experimental results combined with calculations have indicated that a throughput of 15 to 20 wafers/h can be obtained by using the optical system in combination with a compact storage ring. In addition, 0.12-μm line-and-space patterns were delineated in parts of the ring field. The use of alternating and attenuated reflective phase-shifting masks is also discussed to enhance the resolution of EUV lithography.\",\"PeriodicalId\":201185,\"journal\":{\"name\":\"Extreme Ultraviolet Lithography (TOPS)\",\"volume\":\"35 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Extreme Ultraviolet Lithography (TOPS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1364/eul.1996.eww9\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Extreme Ultraviolet Lithography (TOPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/eul.1996.eww9","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A high-throughput optical system that has a bouncing number of only four, including a reflective mask, was designed. The illumination system is comprised of a single tilted-ellipsoidal mirror, that is suitable for a two-aspherical-mirror ring-field imaging system. A prototype optical system was evaluated using synchrotron radiation at the Photon Factory. The experimental results combined with calculations have indicated that a throughput of 15 to 20 wafers/h can be obtained by using the optical system in combination with a compact storage ring. In addition, 0.12-μm line-and-space patterns were delineated in parts of the ring field. The use of alternating and attenuated reflective phase-shifting masks is also discussed to enhance the resolution of EUV lithography.