EUV光刻的光学技术

Masaaki Ito, Souichi Katagiri, H. Yamanashi, Eiichi Seya, T. Ogawa, H. Oizumi, T. Terasawa
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引用次数: 1

摘要

设计了一种高通量光学系统,其反射数仅为4,包括反射掩模。该照明系统由单面倾斜椭球镜组成,适用于双非球面镜环场成像系统。在光子工厂使用同步辐射对原型光学系统进行了评估。实验结果与计算结果相结合表明,将光学系统与紧凑的存储环结合使用,可以获得15 ~ 20片/h的吞吐量。此外,在环场的部分区域还绘制出了0.12 μm的线距图案。本文还讨论了利用互变和衰减反射移相掩模来提高极紫外光刻的分辨率。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Optical Technology for EUV Lithography
A high-throughput optical system that has a bouncing number of only four, including a reflective mask, was designed. The illumination system is comprised of a single tilted-ellipsoidal mirror, that is suitable for a two-aspherical-mirror ring-field imaging system. A prototype optical system was evaluated using synchrotron radiation at the Photon Factory. The experimental results combined with calculations have indicated that a throughput of 15 to 20 wafers/h can be obtained by using the optical system in combination with a compact storage ring. In addition, 0.12-μm line-and-space patterns were delineated in parts of the ring field. The use of alternating and attenuated reflective phase-shifting masks is also discussed to enhance the resolution of EUV lithography.
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