1.4mW 8b 350MS/s环展开SAR ADC与背景偏移校准在40nm CMOS

Kareem Ragab, Nan Sun
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引用次数: 10

摘要

提出了一种分而治之的方法来解决环展开SAR ADC中比较器偏置失配问题。冗余和粗前景校准减轻了MSB比较器偏移不匹配。一个新的背景校准环路匹配LSB比较器偏移到参考比较器。所提出的方案避免了会减慢转换速度的专用校准周期。此外,它确保在校准和正常操作期间每个比较器的输入共模电压跟踪,而不需要外部输入或特殊的DAC配置。这使得使用简单的双向单边开关方案来消除开关逻辑,从而进一步提高速度并降低开关功率。一个8b原型ADC在40nm CMOS中实现了45dB的SNDR和31.3fJ/反步的Nyquist FOM,速度为350MS/s。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A 1.4mW 8b 350MS/s loop-unrolled SAR ADC with background offset calibration in 40nm CMOS
A divide-and-conquer approach to address comparator offset mismatch in loop-unrolled SAR ADC is presented. Redundancy and coarse foreground calibration mitigate MSB comparators offset mismatches. A novel background calibration loop matches LSB comparators offsets to a reference comparator. The proposed scheme avoids a dedicated calibration cycle that would slow down conversion. Additionally, it ensures input common mode voltage tracking for each comparator during both calibration and normal operation, without requiring external inputs or special DAC configuration. This enabled the use of a simple bidirectional single-side switching scheme to eliminate switching logic which further boosts speed and reduces switching power. An 8b prototype ADC achieves 45dB SNDR and a Nyquist FOM of 31.3fJ/conv-step at 350MS/s in 40nm CMOS.
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