由于瞬变电磁炉的不完全终止而引起的集成电路发射测量误差

2008 International Symposium on Electromagnetic Compatibility - EMC Europe Pub Date : 2008-09-01 DOI:10.1109/EMCEUROPE.2008.4786890

V. Mullerwiebus, B. Deutschmann, F. Klotz

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引用次数: 0

摘要

测试PCB采用GTEM电池在集成电路水平上进行广义发射测量。测量结果显示出振荡，这是由于GTEM电池吸收器不完善的影响。考虑并给出了集成电路发射测量中由于吸收器不完善而引起的最大误差，它是吸收器反射系数(或一般的透射电镜细胞的终端)的函数。

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Error of emission measurement of ICs due to imperfect termination of TEM Cell

Test PCB was used for generalized emission measurement on IC level using GTEM cell. Measurements result show an oscillation which is explained as an influence of imperfect absorbers of GTEM cell. The maximum error due to imperfect absorbers of emission measurement for ICs is regarded and given as a function of the reflection coefficient of absorbers (or terminations of TEM cells in general).

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2008 International Symposium on Electromagnetic Compatibility - EMC Europe

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