片上系统时代的调试与诊断

R. Molyneaux
{"title":"片上系统时代的调试与诊断","authors":"R. Molyneaux","doi":"10.1109/TEST.2003.1271143","DOIUrl":null,"url":null,"abstract":"The current scale of integration is the greatest driving force for needing better and faster, debug capabilities. We are truly building systems on a chip, board level interfaces which could previously be monitored and debugged with logic analyzers are now buried on silicon. We need to consider burying the logic analyzers along with the interfaces. The debug task is sometimes made more difficult in today’s environment with the increased reuse of internal IP, the use of externally supplied IP and remote foundries. Internal reuse of IP may not at first seem like a complicating factor but consider the likely fact that few if any of the original designers of that block are still with the company and you are intending to use it in a design that they had not even thought of. With increased IP reuse our marketing folks, in their infinite wisdom, are tempted to offer more parts in the market, many just a small customization of the base model. “Hey just cut the cache in half, slap on a 10/100 IP block from TI, cut the cost by 30% and we’ve opened up a whole new market!” Right! We are not plug and play in the microprocessor component domain yet. We are executing these design customizations but at this time the extended debug phase may more than compensate for the design time saved due to IP purchase or reuse.","PeriodicalId":236182,"journal":{"name":"International Test Conference, 2003. Proceedings. ITC 2003.","volume":"55 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-09-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Debug and diagnosis in the age of system-on-a-chip\",\"authors\":\"R. Molyneaux\",\"doi\":\"10.1109/TEST.2003.1271143\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The current scale of integration is the greatest driving force for needing better and faster, debug capabilities. We are truly building systems on a chip, board level interfaces which could previously be monitored and debugged with logic analyzers are now buried on silicon. We need to consider burying the logic analyzers along with the interfaces. The debug task is sometimes made more difficult in today’s environment with the increased reuse of internal IP, the use of externally supplied IP and remote foundries. Internal reuse of IP may not at first seem like a complicating factor but consider the likely fact that few if any of the original designers of that block are still with the company and you are intending to use it in a design that they had not even thought of. With increased IP reuse our marketing folks, in their infinite wisdom, are tempted to offer more parts in the market, many just a small customization of the base model. “Hey just cut the cache in half, slap on a 10/100 IP block from TI, cut the cost by 30% and we’ve opened up a whole new market!” Right! We are not plug and play in the microprocessor component domain yet. We are executing these design customizations but at this time the extended debug phase may more than compensate for the design time saved due to IP purchase or reuse.\",\"PeriodicalId\":236182,\"journal\":{\"name\":\"International Test Conference, 2003. Proceedings. ITC 2003.\",\"volume\":\"55 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-09-30\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Test Conference, 2003. Proceedings. ITC 2003.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.2003.1271143\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Test Conference, 2003. Proceedings. ITC 2003.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2003.1271143","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

摘要

当前的集成规模是需要更好更快的调试功能的最大推动力。我们真正是在芯片上构建系统,以前可以用逻辑分析仪监控和调试的板级接口现在被埋在硅上。我们需要考虑将逻辑分析器与接口一起隐藏起来。在今天的环境中,随着内部IP的重用增加,使用外部提供的IP和远程代工厂,调试任务有时变得更加困难。IP的内部重用乍一看似乎不是一个复杂的因素,但考虑到可能的事实是,该区块的原始设计师中很少有人仍在公司,而你打算将其用于他们甚至没有想到的设计中。随着IP重复使用的增加,我们的营销人员以他们无限的智慧,试图在市场上提供更多的部件,许多只是基本模型的小定制。“嘿,只要把缓存减少一半,加上德州仪器的10/100 IP块,成本降低30%,我们就打开了一个全新的市场!”没错!我们在微处理器组件领域还不是即插即用的。我们正在执行这些设计定制,但此时扩展的调试阶段可能会弥补由于IP购买或重用而节省的设计时间。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Debug and diagnosis in the age of system-on-a-chip
The current scale of integration is the greatest driving force for needing better and faster, debug capabilities. We are truly building systems on a chip, board level interfaces which could previously be monitored and debugged with logic analyzers are now buried on silicon. We need to consider burying the logic analyzers along with the interfaces. The debug task is sometimes made more difficult in today’s environment with the increased reuse of internal IP, the use of externally supplied IP and remote foundries. Internal reuse of IP may not at first seem like a complicating factor but consider the likely fact that few if any of the original designers of that block are still with the company and you are intending to use it in a design that they had not even thought of. With increased IP reuse our marketing folks, in their infinite wisdom, are tempted to offer more parts in the market, many just a small customization of the base model. “Hey just cut the cache in half, slap on a 10/100 IP block from TI, cut the cost by 30% and we’ve opened up a whole new market!” Right! We are not plug and play in the microprocessor component domain yet. We are executing these design customizations but at this time the extended debug phase may more than compensate for the design time saved due to IP purchase or reuse.
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