J. K. Mellott, E. Monahan, V. Vinayaka, Sachin P. Namboodiri, Angsuman Roy, R. J. Baker
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引用次数: 0
摘要
在某些情况下,提出了一种低成本、低功耗的高功率高速模数转换器(adc)的替代品。这种电路被称为可变快速瞬态数字化(VFTD)。本文概述了该系统的设计和实测试验结果。VFTD设计用于对高速模拟输入信号进行采样,然后以慢得多的速率(例如大约三个数量级)重建捕获的信号。这种方法消除了捕获信号的量化误差。此外,这种方法可以使用慢速、低成本的模数转换器,例如微控制器中的模数转换器。本文讨论的VFTD使用256个顺序采样和保持单元,具有由片外电压源控制的过程相关变量延迟元件。电源电压为5V时,输入范围为0v ~ 3v,对应的输出电压范围为2v ~ 5V,捕获窗口范围为81 ns ~ 1.78µs,采样速率范围为143.82 MS/s ~ 3.16 GS/s。VFTD采用安森美半导体的0.5 μ m C5工艺在2mm x 2mm的芯片上制造,需要0.5 mm x 1.5 mm的面积。
A low cost, low power substitute for expensive, high power high-speed analog-to-digital converters (ADCs) in some situations is presented. This circuit is called a variable fast transient digitizer (VFTD). This paper provides an overview of the design and measured test results. The VFTD is designed to sample a high-speed analog input signal and later reconstruct the captured signal at a much slower rate, for example, around three orders of magnitude. This approach eliminates quantization error in the captured signal. Further, this approach enables the use of slow, low cost, analog-to-digital converters such as those found in microcontrollers. The VFTD discussed in this paper uses 256 sequential sample and hold cells with a process dependent variable delay element controlled by an off-chip voltage source. Using a power supply voltage of 5V the input range extends from 0 V to 3 V corresponding to an output voltage range from 2 V to 5 V, a capture window range from 81 ns to 1.78 µs, and a sampling rate range from 143.82 MS/s to 3.16 GS/s. The VFTD is fabricated on a 2 mm x 2 mm die using ON Semiconductor's 0.5 µm C5 process and requires a 0.5 mm x 1.5 mm area.