使用阵列响应插值和参数化建模的阵列校准

Bin Yang, T. McKelvey, M. Viberg, Guanghan Xu
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引用次数: 4

摘要

高性能阵列应用通常需要精确的阵列响应模型。实现这一目标的一种常用方法是通过阵列校准,其中包括测量有限数量的给定源方向的响应并采用插值。本文将插值技术与参数化建模相结合,研究了阵列标定问题。其思想是将阵列响应建模为相互耦合矩阵、理想阵列响应向量(源自天线阵列的几何形状)和与角度相关的校正向量的乘积。由于主要影响是由物理模型和相互耦合矩阵捕获的,因此与直接插值测量阵列响应相比,校正向量将是一个更平滑的角度函数。在实际天线阵的数值实验中,该方法显著提高了天线阵的标定性能。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Array calibration using array response interpolation and parametric modeling
High-performance array applications often require an accurate array response model. A common way to achieve this is by array calibration which involves measuring the response for a finite number of given source directions and employing interpolation. This paper considers the array calibration problem by combing interpolation techniques and parametric modeling. The idea is to model the array response as a product of a mutual coupling matrix, an ideal array response vector (derived from the geometry of antenna array) and an angle-dependent correction vector. Since the major effects are captured by the physical model and the mutual coupling matrix, the correction vector will be a smoother function of angle as compared to direct interpolation of the measured array response. In numerical experiments of a real antenna array, the method is found to improve the performance of the array calibration significantly.
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