低成本晶圆级CSP:一种新的再分配方法

G. Rinne, J. Wallin, J. D. Mis
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引用次数: 1

摘要

针对低成本、小尺寸集成电路,开发了一种采用晶圆级工艺的芯片级封装。该封装采用聚合物再钝化和电沉积焊料凸起,通过独特的导体模式方法连接。作为将线键设计转换为CSP的铝再分配方法的替代方法,开发了一种低成本的方法。这个过程被称为单掩模再分配(SMR),在一个单一的图案步骤中产生焊料凸起和再分配线。焊料在管线和凸垫上被镀到相同的高度,在回流过程中,静水压力使管线上多余的焊料流向凸垫。完成的封装类似于一个普通的芯片电阻。通过可靠性测试优化凹凸设计和装配方法。超过3000万个包的现场性能验证了测试结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Low cost wafer-level CSP: a novel redistribution methodology
A chip scale package using wafer scale processing was developed for a line of low cost, small form factor integrated circuits. The package uses polymeric repassivation and electrodeposited solder bumps connected by a unique conductor patterning method. As an alternative to the aluminum redistribution approach for converting wirebond designs to CSP, a low cost method was developed. Called single-mask redistribution (SMR), this process creates the solder bump and the redistribution line in a single patterning step. Solder is plated to an equal height on both the line and the bump pad and, during reflow, hydrostatic pressure causes the excess solder on the line to flow to the bump. The finished package resembles a common chip resistor. Reliability testing was used to optimize the bump design and the assembly methodologies. Field performance of more than 30 million packages has validated the test results.
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