深度神经网络可靠性评估中故障注入方法的优缺点

A. Ruospo, Lucas Matana Luza, A. Bosio, Marcello Traiola, L. Dilillo, Ernesto Sánchez
{"title":"深度神经网络可靠性评估中故障注入方法的优缺点","authors":"A. Ruospo, Lucas Matana Luza, A. Bosio, Marcello Traiola, L. Dilillo, Ernesto Sánchez","doi":"10.1109/LATS53581.2021.9651807","DOIUrl":null,"url":null,"abstract":"In the last years, the adoption of Artificial Neural Networks (ANNs) in safety-critical applications has required an in-depth study of their reliability. For this reason, the research community has shown a growing interest in understanding the robustness of artificial computing models to hardware faults. Indeed, several recent studies have demonstrated that hardware faults induced by an external perturbation or due to silicon wear out and aging effects can significantly impact the ANN inference leading to wrong predictions. This work classifies and analyses the principal reliability assessment methodologies based on Fault Injection at different abstraction levels and with different procedures. Some of the most representative academic and industrial works proposed in the literature are described and the principal advantages, and drawbacks are highlighted.","PeriodicalId":404536,"journal":{"name":"2021 IEEE 22nd Latin American Test Symposium (LATS)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-10-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Pros and Cons of Fault Injection Approaches for the Reliability Assessment of Deep Neural Networks\",\"authors\":\"A. Ruospo, Lucas Matana Luza, A. Bosio, Marcello Traiola, L. Dilillo, Ernesto Sánchez\",\"doi\":\"10.1109/LATS53581.2021.9651807\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In the last years, the adoption of Artificial Neural Networks (ANNs) in safety-critical applications has required an in-depth study of their reliability. For this reason, the research community has shown a growing interest in understanding the robustness of artificial computing models to hardware faults. Indeed, several recent studies have demonstrated that hardware faults induced by an external perturbation or due to silicon wear out and aging effects can significantly impact the ANN inference leading to wrong predictions. This work classifies and analyses the principal reliability assessment methodologies based on Fault Injection at different abstraction levels and with different procedures. Some of the most representative academic and industrial works proposed in the literature are described and the principal advantages, and drawbacks are highlighted.\",\"PeriodicalId\":404536,\"journal\":{\"name\":\"2021 IEEE 22nd Latin American Test Symposium (LATS)\",\"volume\":\"10 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-10-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 IEEE 22nd Latin American Test Symposium (LATS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/LATS53581.2021.9651807\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE 22nd Latin American Test Symposium (LATS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/LATS53581.2021.9651807","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

摘要

在过去的几年里,人工神经网络(ann)在安全关键应用中的应用需要对其可靠性进行深入研究。由于这个原因,研究界对理解人工计算模型对硬件故障的鲁棒性表现出越来越大的兴趣。事实上,最近的几项研究表明,由外部扰动或硅磨损和老化效应引起的硬件故障会严重影响人工神经网络推理,导致错误的预测。本文对基于故障注入的主要可靠性评估方法进行了分类和分析,并在不同的抽象层次上采用了不同的步骤。介绍了文献中提出的一些最具代表性的学术和工业作品,并突出了主要优点和缺点。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Pros and Cons of Fault Injection Approaches for the Reliability Assessment of Deep Neural Networks
In the last years, the adoption of Artificial Neural Networks (ANNs) in safety-critical applications has required an in-depth study of their reliability. For this reason, the research community has shown a growing interest in understanding the robustness of artificial computing models to hardware faults. Indeed, several recent studies have demonstrated that hardware faults induced by an external perturbation or due to silicon wear out and aging effects can significantly impact the ANN inference leading to wrong predictions. This work classifies and analyses the principal reliability assessment methodologies based on Fault Injection at different abstraction levels and with different procedures. Some of the most representative academic and industrial works proposed in the literature are described and the principal advantages, and drawbacks are highlighted.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信