{"title":"利用电路描述的层次性,高效的故障模拟","authors":"B.H. Seiss, H. Wittmann","doi":"10.1109/ATS.1992.224434","DOIUrl":null,"url":null,"abstract":"A highly efficient fault simulation approach is presented taking advantage of the hierarchy which can be found in most of todays circuit descriptions. Evident graphs are introduced to represent the structure of the hierarchy. Numerous experimental results for industrial circuits with up 90000 gates demonstrate the efficiency of the approach with respect to acceleration and reduction of the memory requirements as compared to an efficient gate level fault simulator.<<ETX>>","PeriodicalId":208029,"journal":{"name":"Proceedings First Asian Test Symposium (ATS `92)","volume":"52 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-11-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Highly efficient fault simulation exploiting hierarchy in circuit description\",\"authors\":\"B.H. Seiss, H. Wittmann\",\"doi\":\"10.1109/ATS.1992.224434\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A highly efficient fault simulation approach is presented taking advantage of the hierarchy which can be found in most of todays circuit descriptions. Evident graphs are introduced to represent the structure of the hierarchy. Numerous experimental results for industrial circuits with up 90000 gates demonstrate the efficiency of the approach with respect to acceleration and reduction of the memory requirements as compared to an efficient gate level fault simulator.<<ETX>>\",\"PeriodicalId\":208029,\"journal\":{\"name\":\"Proceedings First Asian Test Symposium (ATS `92)\",\"volume\":\"52 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-11-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings First Asian Test Symposium (ATS `92)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATS.1992.224434\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings First Asian Test Symposium (ATS `92)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.1992.224434","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Highly efficient fault simulation exploiting hierarchy in circuit description
A highly efficient fault simulation approach is presented taking advantage of the hierarchy which can be found in most of todays circuit descriptions. Evident graphs are introduced to represent the structure of the hierarchy. Numerous experimental results for industrial circuits with up 90000 gates demonstrate the efficiency of the approach with respect to acceleration and reduction of the memory requirements as compared to an efficient gate level fault simulator.<>