基于分布式动态分区的扫描链诊断

2013 IEEE 31st VLSI Test Symposium (VTS) Pub Date : 2013-04-29 DOI:10.1109/VTS.2013.6548916

Yu Huang, Xiaoxin Fan, Huaxing Tang, Manish Sharma, Wu-Tung Cheng, B. Benware, S. Reddy

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引用次数: 12

摘要

大型设计的诊断内存占用随着设计规模的增长而增长，因此给定计算资源的诊断吞吐量成为批量诊断的瓶颈。本文提出了一种基于动态设计划分和分布式诊断架构的扫描链诊断流程，可将诊断吞吐量提高一个数量级以上。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Distributed dynamic partitioning based diagnosis of scan chain

Diagnosis memory footprint for large designs is growing as design sizes grow such that the diagnosis throughput for given computational resources becomes a bottleneck in volume diagnosis. In this paper, we propose a scan chain diagnosis flow based on dynamic design partitioning and distributed diagnosis architecture that can improve the diagnosis throughput over one order of magnitude.

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2013 IEEE 31st VLSI Test Symposium (VTS)

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