E. Buturla, P. Cottrell, B. Grossman, K. Salsburg, M. Lawlor, C. McMullen
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Three-dimensional finite element simulation of semiconductor devices
Mobile carrier transport in semiconductors, simulated in three dimensions, using the finite element method, will be reported. The algorithm has been used to model the combined effect of short channel lengths and narrow channel widths on the threshold of an IGFET.