基于In4Se3、In4Te3和In4(Se3)1-x(Te3)x半导体的晶体和异质结构的结构、光学和光电性质

M. O. Sorokatyi, V. Strebezhev, I. Yuriychuk, S. Nichyi, V. Pylypko
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引用次数: 0

摘要

研究了射频阴极溅射制备的CdSb-In4Se3、CdSb-In4Te3和CdSb-In4(Se3)1-xTe3x异质结和液相外延制备的In4Se3-In4(Se3)1-xTe3x、In4Se3-In4Te3异质结的结构特征。全面的SEM, EDS和AFM测量允许设置异质结的激光处理条件,以执行其结构和光敏特性的光子校正。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Structural, Optical and Photoelectric Properties of Crystals and Heterostructures Based on the In4Se3, In4Te3, and In4(Se3)1-x(Te3)x Semiconductors
The structural features of the CdSb-In4Se3, CdSb-In4Te3, and CdSb-In4(Se3)1-xTe3x heterojunctions obtained by RF cathode sputtering and the In4Se3-In4(Se3)1-xTe3x, In4Se3-In4Te3 heterojunctions obtained by liquid-phase epitaxy are studied. Comprehensive SEM, EDS, and AFM measurements allow to set the conditions of laser treatment of the heterojunctions for performing photon correction of their structural and photosensitive properties.
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