{"title":"互连中频率相关导体损耗的仿真","authors":"D. Divekar, R. Raghuram, F. Balistreri, N. Matsui","doi":"10.1109/ECTC.1996.550514","DOIUrl":null,"url":null,"abstract":"Simulation of frequency dependence of conductor losses is important for getting accurate electrical performance data of interconnects. The method of characteristics is extended to take into account this effect. The method is well suited for incorporating into a general purpose circuit analysis program for time domain simulation. This enables the analysis of interconnects connected in any arbitrary topology along with the associated nonlinear circuits for high speed digital and analog systems.","PeriodicalId":143519,"journal":{"name":"1996 Proceedings 46th Electronic Components and Technology Conference","volume":"3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-05-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Simulation of frequency dependent conductor loss in interconnects\",\"authors\":\"D. Divekar, R. Raghuram, F. Balistreri, N. Matsui\",\"doi\":\"10.1109/ECTC.1996.550514\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Simulation of frequency dependence of conductor losses is important for getting accurate electrical performance data of interconnects. The method of characteristics is extended to take into account this effect. The method is well suited for incorporating into a general purpose circuit analysis program for time domain simulation. This enables the analysis of interconnects connected in any arbitrary topology along with the associated nonlinear circuits for high speed digital and analog systems.\",\"PeriodicalId\":143519,\"journal\":{\"name\":\"1996 Proceedings 46th Electronic Components and Technology Conference\",\"volume\":\"3 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1996-05-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1996 Proceedings 46th Electronic Components and Technology Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ECTC.1996.550514\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1996 Proceedings 46th Electronic Components and Technology Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.1996.550514","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Simulation of frequency dependent conductor loss in interconnects
Simulation of frequency dependence of conductor losses is important for getting accurate electrical performance data of interconnects. The method of characteristics is extended to take into account this effect. The method is well suited for incorporating into a general purpose circuit analysis program for time domain simulation. This enables the analysis of interconnects connected in any arbitrary topology along with the associated nonlinear circuits for high speed digital and analog systems.
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