{"title":"基本CMOS电池的几何优化以改善功率、泄漏和噪声性能","authors":"J. Castro, A. Acosta, M. Vesterbacka","doi":"10.1109/ENICS.2008.26","DOIUrl":null,"url":null,"abstract":"The rising demand for portable system is increasing the importance of low power as a design consideration. In this sense, leakage power is increasing much faster than dynamic power at smaller dimensions. Peak values of supply current are related to noise injected into the substrate and/or propagated through supply network, limiting the performances of the sensitive analog and RF portions of mixed-signal circuits. This paper analyses how these three aspects, dynamic power, leakage power and peak power, can be considered together, optimizing the sizing and design of basic cells, with a reduced degradation in performances. The suited sizing of basic cells, show the benefits of the proposed technique, validated through simulation results on 130 nm nand, nor and inverter cells.","PeriodicalId":162793,"journal":{"name":"2008 International Conference on Advances in Electronics and Micro-electronics","volume":"36 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-09-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Geometry Optimization in Basic CMOS Cells for Improved Power, Leakage, and Noise Performances\",\"authors\":\"J. Castro, A. Acosta, M. Vesterbacka\",\"doi\":\"10.1109/ENICS.2008.26\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The rising demand for portable system is increasing the importance of low power as a design consideration. In this sense, leakage power is increasing much faster than dynamic power at smaller dimensions. Peak values of supply current are related to noise injected into the substrate and/or propagated through supply network, limiting the performances of the sensitive analog and RF portions of mixed-signal circuits. This paper analyses how these three aspects, dynamic power, leakage power and peak power, can be considered together, optimizing the sizing and design of basic cells, with a reduced degradation in performances. The suited sizing of basic cells, show the benefits of the proposed technique, validated through simulation results on 130 nm nand, nor and inverter cells.\",\"PeriodicalId\":162793,\"journal\":{\"name\":\"2008 International Conference on Advances in Electronics and Micro-electronics\",\"volume\":\"36 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-09-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 International Conference on Advances in Electronics and Micro-electronics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ENICS.2008.26\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 International Conference on Advances in Electronics and Micro-electronics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ENICS.2008.26","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Geometry Optimization in Basic CMOS Cells for Improved Power, Leakage, and Noise Performances
The rising demand for portable system is increasing the importance of low power as a design consideration. In this sense, leakage power is increasing much faster than dynamic power at smaller dimensions. Peak values of supply current are related to noise injected into the substrate and/or propagated through supply network, limiting the performances of the sensitive analog and RF portions of mixed-signal circuits. This paper analyses how these three aspects, dynamic power, leakage power and peak power, can be considered together, optimizing the sizing and design of basic cells, with a reduced degradation in performances. The suited sizing of basic cells, show the benefits of the proposed technique, validated through simulation results on 130 nm nand, nor and inverter cells.