基本CMOS电池的几何优化以改善功率、泄漏和噪声性能

J. Castro, A. Acosta, M. Vesterbacka
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引用次数: 1

摘要

对便携式系统的需求日益增长,低功耗作为设计考虑因素的重要性日益增加。从这个意义上说,在较小的尺寸上,泄漏功率比动态功率增长得快得多。供电电流的峰值与注入基板和/或通过供电网络传播的噪声有关,这限制了混合信号电路中敏感的模拟和射频部分的性能。本文分析了如何同时考虑动态功率、泄漏功率和峰值功率这三个方面,优化基本电池的尺寸和设计,减少电池性能的下降。基本电池尺寸合适,显示了该技术的优势,并通过130 nm nand, nor和逆变器电池的仿真结果进行了验证。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Geometry Optimization in Basic CMOS Cells for Improved Power, Leakage, and Noise Performances
The rising demand for portable system is increasing the importance of low power as a design consideration. In this sense, leakage power is increasing much faster than dynamic power at smaller dimensions. Peak values of supply current are related to noise injected into the substrate and/or propagated through supply network, limiting the performances of the sensitive analog and RF portions of mixed-signal circuits. This paper analyses how these three aspects, dynamic power, leakage power and peak power, can be considered together, optimizing the sizing and design of basic cells, with a reduced degradation in performances. The suited sizing of basic cells, show the benefits of the proposed technique, validated through simulation results on 130 nm nand, nor and inverter cells.
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